CBI has arrested two more individuals in connection with the NEET-UG paper leak case, further expanding its investigation into one of the country’s most high profile examination fraud scandals.

Among those arrested is Manoj Shirure, a doctor based in Latur, Maharashtra. According to a statement issued by the CBI, Shirure allegedly played a key role in facilitating access to leaked Chemistry examination questions for three students, including the son of a coaching centre owner who is also an accused in the case.

Investigators allege that the questions were obtained from P. V. Kulkarni, a Latur based chemistry lecturer who has been identified as a co-accused and one of the alleged masterminds behind the operation. The agency claims the accused were involved in sharing confidential examination content before the test, compromising the integrity of the national medical entrance examination.

The arrests are part of the CBI’s ongoing investigation into irregularities surrounding NEET-UG, India’s largest medical entrance examination. The exam is conducted by the National Testing Agency (NTA) and is taken annually by more than 24 lakh aspirants seeking admission to MBBS, BDS, AYUSH, and other undergraduate medical courses.

The NEET-UG controversy triggered nationwide concern last year after allegations of paper leaks, inflated scores, and examination malpractice surfaced across multiple states. Following public protests and legal challenges, the matter reached the Supreme Court, leading to a wider review of examination security and accountability mechanisms.

CBI officials have stated that investigations are continuing to identify additional beneficiaries, facilitators, and members of the alleged network. The agency is examining financial transactions, communication records, and links between coaching institutes, intermediaries, and examination related personnel.

Education experts say the latest arrests highlight the urgent need for stronger examination security measures and greater transparency in India’s competitive entrance testing system, which impacts millions of students each year.